The novel vacuum-diffractometer which CMC develops in collaboration with prof.emer. Jens Als-Nielsen (KU) and J.J. X-ray (DTU) is recieving final adjustments at the workshop of Dept. of Chemistry (AU). The sample cooling system is overhauled and the diffractometer is prepared for the inclusion of a brand new Amptek XR-100T-CdTe energy-dispersive detector used to detect sample position and provide auxillary data which are crucial to the treatment of the as-acquired diffractograms.